Description
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Equotip Live UCI creates new
opportunities for collaboration in portable hardness testing. The
Equotip iOS app allows you to conduct measurements at a remote location
and provide instant access of your results to your team. |
The world’s first full IoT portable
wireless hardness testing solution with real-time data sharing, cloud
backup and intuitive user interface. The ultra portable Equotip Live
Leeb D impact device is perfect for use in confined spaces. |
Flexible UCI hardness tester for
fine-grained material with any shape and heat-treated surfaces. The
patented adjustable test load enables a wide range of applications.
Rugged touchscreen with enhanced software features and analysis
functions. Equotip 540 for regular basic usage without extensive reporting needs. |
Portable Rockwell hardness tester for
scratch-sensitive, polished and thin parts. It features excellent
sensitivity through small penetration of a few micrometer. Rugged
touchscreen with enhanced software features and analysis functions. |
Versatile Leeb hardness tester for
on-site testing of heavy, large or installed parts. Rugged touchscreen
designed to provide an exceptional user experience and best possible
measuring and analysis. Enhanced software features and analysis
functions. Equotip 540 for regular basic usage without extensive reporting needs. |
Fully integrated and handy Leeb hardness
tester with a compact and robust housing. Ideally suited for quick
on-site hardness tests. Optional DL probe for confined spaces and
recessed surfaces. Equotip Piccolo 2 allows the transfer of the data to a
PC. |
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Read more
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Read more
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Your Benefits
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Instantly share your measurements and reports
Logbook for full data traceability
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Wireless impact device and clean user-interface
Easily share your measurements and reports in real-time worldwide
Logbook for full data traceability and to add media
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Combine with Leeb and Portable Rockwel
On-screen feedback to reduce measurement inaccuracies caused by the operator
Ready-to-go reports through powerful built-in reporting feature
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Combine with Leeb and UCI
Equally reliable, accurate and standardized but faster than stationary Rockwell hardness testers
Ready-to-go reports through powerful built-in reporting feature
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Use full Leeb probe portfolio and combine with Portable Rockwell and UCI
Comes with the high accuracy known for all Equotip products
Ready-to-go reports through powerful built-in reporting feature
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Entry model for quick on-site tests
Compact housing and automatic angle correction allow flexible use
Comes with the high accuracy known for all Equotip products
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Native Scale
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HV (UCI) |
HL |
HV (UCI) |
µm, µinch |
HL |
HL |
Measuring Range
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20 – 2000 HV |
150 - 950 HL |
20 - 2000 HV |
0 - 100 µm; 19 - 70 HRC; 35 - 1‘000 HV |
150 - 950 HL |
150 – 950 HL |
Measuring Accuracy
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± 2% (150 – 950 HV) |
± 4 HL (0.5% at 800 HL) |
± 2% (150 - 950 HV) |
± 0.8 µm; ~ ± 1.0 HRC |
± 4 HL (0.5% at 800 HL) |
± 4 HL (0.5% at 800 HL) |
Available Scales
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HB, HV, HLD, HRA, HRB, HRC, HR15N, HR15T, MPA |
HB, HV, HRB, HRC, HS, MPA |
HB, HV, HRA, HRB, HRC, HR15N, HR15T, MPA |
HB, HV, HRA, HRB, HRC, R15N, HR15T, HMMRC, MPA |
HB, HV, HRA, HRB, HRC, HS, MPA |
HB, HV, HRB, HRC, HS, MPA (Equotip Piccolo 2 only) |
Available Probes
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Universal probe with adjustable test load between HV1 and HV10 |
Leeb D |
UCI (Adjustable HV1 - HV5) |
Portable Rockwell Probe 50N (can also be connected directly to PC) |
Leeb D / DC / DL / S / E / G / C |
Leeb D / DL |
Combination With Other Methods
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Leeb, Portable Rockwell |
Leeb, UCI |
Portable Rockwell, UCI |
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Average Roughness Ra (µm / µinch)
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12.5 / 500 |
2 / 80 |
12.5 / 500 |
2 / 80 |
7 / 275 (Leeb G) |
2 / 80 |
Minimum Mass (kg / lbs)
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0.3 / 0.66 |
0.05 / 0.2 |
0.3 / 0.66 |
No requirement |
0.02 / 0.045 (Leeb C) |
0.05 / 0.2 |
Minimum Thickness (mm / inch)
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5 / 0.2 |
3 / 0.12 |
5 / 0.2 |
10 x indendation depth |
1 / 0.04 (Leeb C) |